We have a Film Sense FS-1 Multi-Wavelength Ellipsometer. The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.
![](http://nff.pages.ist.ac.at/wp-content/uploads/sites/97/2018/10/FS-1-Front-300x151.jpg)
Tool Owner: Juan Aguilera