The LEAP 6000 XR atom probe system is designed for high-resolution 3D imaging and chemical composition analysis at the atomic scale. By combining voltage and laser pulsing, the system enables precise identification of atomic features, including solute clusters, precipitates, dislocations, and grain boundaries, along with their spatial distribution within a material. This advanced technology is widely used in materials science, metallurgy, and semiconductor research.
- Deep UV laser wavelength for improved yield and enhanced reconstruction accuracy
- Synchronous voltage and laser pulsing (VLP) for higher sensitivity and easier peak identification
- LEAP automation enabling unattended operation for increased throughput and efficiency
- High-resolution 3D imaging with sub-nanometer spatial resolution (0.1-0.3 nm depth, 0.3-0.5 nm laterally)
- Ultra-high vacuum environment (~1 x 10⁻¹¹ Torr) ensuring minimal contamination
- Integrated with dual-beam focused-ion beam (FIB) sample preparation for site-specific analysis
User Support and Scientific Advice:
Qi Wang – Qi.Wang@ist.ac.at
Evgeniia Volobueva – Evgeniia.Volobueva@ist.ac.at